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Characterization of defects in Mg doped GaN epitaxial layers using conductance measurements

✍ Scribed by O.S. Elsherif; K.D. Vernon-Parry; I.M. Dharmadasa; J.H. Evans-Freeman; R.J. Airey; M.J. Kappers; C.J. Humphreys

Book ID: 113937461
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 751 KB
Volume: 520
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2011.11.020

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