Characterization of defects in hydrogenated amorphous silicon devices using charge collection scanning electron microscopy

✍ Scribed by B. G. Yacobi; R. J. Matson; C. R. Herrington

• Book ID: 112814904
• Publisher: Springer US
• Year: 1984
• Tongue: English
• Weight: 921 KB
• Volume: 13
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/bf02655303