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Characterization of CuI thin films prepared by different techniques

✍ Scribed by P.M Sirimanne; M Rusop; T Shirata; T Soga; T Jimbo

Book ID
114193443
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
173 KB
Volume
80
Category
Article
ISSN
0254-0584

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## Abstract Cuprous iodide (CuI) thin films were prepared by a pulsed laser deposition (PLD) technique, and the effects of the laser energy and substrate temperature on the structure and optical–electrical properties were investigated by X‐ray diffraction (XRD), scanning electronic microscopy (SEM)