Characterization of crystal growth defects by X-ray methods: NATO Advanced Study Institute, Series B: Physics; edited by B. K. Tanner and D. K. Bowen; published by Plenum, New York, 1980; 589 pp.; price, U.S. $65

✍ Scribed by J.B. Cohen

• Publisher: Elsevier Science
• Year: 1982
• Weight: 70 KB
• Volume: 56
• Category: Article
• ISSN: 0025-5416
• DOI: 10.1016/0025-5416(82)90174-4