✦ LIBER ✦
B. K. Tanner, D. K. Bowen. Characterization of Crystal Growth Defects by X-ray Methods. New York and London, publ. in cooperation with NATO Scientific Affairs Division 1980, 589 Seiten mit 364 Abbildungen und 26 Tabellen, Leinen Preis: US $ 65.00
✍ Scribed by P. Paufler
- Publisher
- John Wiley and Sons
- Year
- 1981
- Tongue
- English
- Weight
- 69 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0232-1300
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