Characterization of crosstalk noise in submicron CMOS integrated circuits: an experimental view

✍ Scribed by Fourniols, J.-Y.; Roca, M.; Caignet, F.; Sicard, E.

• Book ID: 114534114
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 293 KB
• Volume: 40
• Category: Article
• ISSN: 0018-9375
• DOI: 10.1109/15.709426