## Abstract A new measurement technique is presented to determine the complex permittivity of a dielectric material. The dielectric sample is loaded in a short‐circuited rectangular waveguide. The reflection coefficient of the waveguide is measured by Network analyzer and calculated as a function o
✦ LIBER ✦
Characterization of complex permittivity properties of materials in rectangular waveguides using a hybrid iterative method
✍ Scribed by Esteban, H.; Catala-Civera, J.M.; Cogollos, S.; Boria, V.E.
- Book ID
- 114561901
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 50 KB
- Volume
- 10
- Category
- Article
- ISSN
- 1051-8207
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## Abstract Free‐space method approaches for obtaining the complex permittivity of dielectric layers embedded in a multilayer dielectric material are investigated. Solids, liquids, and granular materials have been tested; a description of the de‐embedding process is presented in detail, as are the