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Characterization of Ce O2thin films on a sapphire

✍ Scribed by S.V. Sokolov; A.V. Knotko; V.I. Putlayev; A.R. Kaul

Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 561 KB
Volume: 24
Category: Article
ISSN: 0749-6036
DOI: 10.1006/spmi.1996.0433

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