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Characterization of CdTe substrates and MOCVD Cd1−xZnxTe epilayers by Raman, photoluminescence and X-ray diffraction techniques

✍ Scribed by M Levy; N Amir; E Khanin; A Muranevich; Y Nemirovsky; R Beserman

No coin nor oath required. For personal study only.

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MOCVD growth and characterization by Ram

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Post irradiated microstructural characte

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