✦ LIBER ✦

Characterization of calcium oxalate crystals in woody plants by X-ray microarea diffractometry

✍ Scribed by T. Taniguchi; H. Harada

Publisher: Springer
Year: 1987
Tongue: English
Weight: 839 KB
Volume: 43
Category: Article
ISSN: 1420-682X
DOI: 10.1007/bf01952219

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of Boron Implanted Sili

Characterization of Boron Implanted Silicon by X-Ray Triple–Crystal Diffractometry

✍ Zaumseil, P. ;Winter, U. 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 480 KB

Determination of low levels of quartz in

Determination of low levels of quartz in calcium carbonates by x-ray diffractometry

✍ N.J. Elton; P.D. Salt 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 898 KB

Naturally occurring calcium carbonates often have a complex accessory mineralogy. Quartz is a common associate, typically present at concentrations < 1 wt.%. A method is described whereby x-ray powder diffractometry may be used to quantify quartz in such samples to better than f 0.01 wt.% (la error)

Characterization of ground-based and spa

Characterization of ground-based and space-based mercuric iodide single crystals by means of X-ray topography and diffractometry

✍ S. Leon-Gits; E. Fries 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 510 KB

Study of tetragonal domains in the cubic

Study of tetragonal domains in the cubic phase of RbCaF3 crystals by means of X-ray diffractometry

✍ C. Ridou; M. Rousseau; A. Freud 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 392 KB

Mapping and analysis of microplasticity

Mapping and analysis of microplasticity in tensile-deformed double-notched silicon crystals by computer-aided X-ray double-crystal diffractometry

✍ H.Y. Liu; W.E. Mayo; S. Weissmann 📂 Article 📅 1984 🏛 Elsevier Science ⚖ 974 KB

Characterization of in-plane structures

Characterization of in-plane structures of vapor deposited thin-films of distyryl-oligothiophenes by grazing incidence x-ray diffractometry

✍ Noriyuki Yoshimoto; Keijyu Aosawa; Toshinori Taniswa; Kazuhiko Omote; J. Ackerma 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 518 KB

## Abstract The in‐plane structures of vapor deposited ultrathin films of distyryl‐oligothiophenes (DS‐2T) on SiO~2~ substrate were characterized by grazing incidence x‐ray diffractometry (GIXD). Two polymorphs, low‐temperature and high‐temperature phases, were identified, and the two dimensional u