Characterization of biaxial stress and its effect on optical properties of ZnO thin films

✍ Scribed by Li, Y. F.; Yao, B.; Lu, Y. M.; Cong, C. X.; Zhang, Z. Z.; Gai, Y. Q.; Zheng, C. J.; Li, B. H.; Wei, Z. P.; Shen, D. Z.; Fan, X. W.; Xiao, L.; Xu, S. C.; Liu, Y.

• Book ID: 118006596
• Publisher: American Institute of Physics
• Year: 2007
• Tongue: English
• Weight: 509 KB
• Volume: 91
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2757149