𝔖 Bobbio Scriptorium
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Characterization of back-channel subthreshold conduction of walled SOI devices

✍ Scribed by Chen, H.; Yue, J.; Dougal, G.


Book ID
114534813
Publisher
IEEE
Year
1991
Tongue
English
Weight
151 KB
Volume
38
Category
Article
ISSN
0018-9383

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