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Characterization of apodized fiber Bragg gratings for rejection filter applications

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Book ID
115346704
Publisher
The Optical Society
Year
1997
Tongue
English
Weight
319 KB
Volume
36
Category
Article
ISSN
1559-128X

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We analyze the effects of periodic phase shifts due to stitching errors in phase masks made by electron beam lithography. Fiber gratings written with these masks show sidebands, the strength of which is used to determine the value of the phase shift.