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Characterization of AlF_3 thin films at 193 nm by thermal evaporation

✍ Scribed by Lee, Cheng-Chung ;Liu, Ming-Chung ;Kaneko, Masaaki ;Nakahira, Kazuhide ;Takano, Yuuichi


Book ID
115352476
Publisher
The Optical Society
Year
2005
Tongue
English
Weight
785 KB
Volume
44
Category
Article
ISSN
1559-128X

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