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Characterization of a self-aligned RTP titanium disilicide MOS process: titanium-silicon dioxide interaction

✍ Scribed by W. Kaplan; S.-L. Zhang; H. Norström; M. Östling; A. Lindberg


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
548 KB
Volume
53
Category
Article
ISSN
0169-4332

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