Characterization of 4H semi-insulating silicon carbide single crystals using electron beam induced current

✍ Scribed by Peter G. Muzykov; Ramesh Krishna; Sandip Das; Timothy Hayes; Tangali S. Sudarshan; Krishna C. Mandal

• Book ID: 113794160
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 301 KB
• Volume: 65
• Category: Article
• ISSN: 0167-577X
• DOI: 10.1016/j.matlet.2010.11.074