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Characterization and Parasitic Extraction of EMI Filters Using Scattering Parameters

✍ Scribed by Wang, S.; Lee, F.C.; Odendaal, W.G.

Book ID: 120204586
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 933 KB
Volume: 20
Category: Article
ISSN: 0885-8993
DOI: 10.1109/TPEL.2004.842949

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