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[IEEE Conference Record of the 2004 IEEE Industry Applications Conference, 2004. 39th IAS Annual Meeting. - Seattle, WA, USA (3-7 Oct. 2004)] Conference Record of the 2004 IEEE Industry Applications Conference, 2004. 39th IAS Annual Meeting. - Extraction of parasitic parameters of EMI filters using scattering parameters

โœ Scribed by Shuo Wang, ; Odendaal, W.G.; Lee, F.C.


Book ID
121820339
Publisher
IEEE
Year
2004
Tongue
English
Weight
667 KB
Volume
4
Category
Article
ISBN-13
9780780384866

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[IEEE Conference Record of the 2004 IEEE