Characteristics and mechanism of conduction/set process in TiN∕ZnO∕Pt resistance switching random-access memories

✍ Scribed by Xu, Nuo; Liu, Lifeng; Sun, Xiao; Liu, Xiaoyan; Han, Dedong; Wang, Yi; Han, Ruqi; Kang, Jinfeng; Yu, Bin

• Book ID: 121392090
• Publisher: American Institute of Physics
• Year: 2008
• Tongue: English
• Weight: 834 KB
• Volume: 92
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2945278