Characteristic Degradation of Poly-Si Thin-Film Transistors With Large Grains From the Viewpoint of Grain Boundary Location

✍ Scribed by Kimura, M.; Dimitriadis, C.A.

• Book ID: 114620464
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 514 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2135356