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Analytical Drain Current Model for Poly-Si Thin-Film Transistors Biased in Strong Inversion Considering Degradation of Tail States at Grain Boundary
✍ Scribed by Wang, Lisa L.; Kuo, James B.; Zhang, Shengdong
- Book ID
- 124086535
- Publisher
- IEEE
- Year
- 2013
- Tongue
- English
- Weight
- 609 KB
- Volume
- 60
- Category
- Article
- ISSN
- 0018-9383
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