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Characterisation of reliability of compound semiconductor devices using electrical pulses

✍ Scribed by M. Brandt; V. Krozer; M. Schüβler; K.-H. Bock; H.-L. Hartnagel

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 343 KB
Volume: 36
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(96)00222-3

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