✦ LIBER ✦
Reliability of compound semiconductor microwave field-effect devices: failure mechanisms and test methods : G. Clerico Titinet, E. Pollino and D. E. Riva. Microelectron. J.21(6), 33 (1990)
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 133 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0026-2714
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