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Characterisation of defects in very high deep-etch X-ray lithography microstructures

✍ Scribed by F. J. Pantenburg; S. Achenbach; J. Mohr


Book ID
106186306
Publisher
Springer-Verlag
Year
1998
Tongue
English
Weight
890 KB
Volume
4
Category
Article
ISSN
0946-7076

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