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Channeling dips for Si K and L X-ray yield

✍ Scribed by Allen Lurio; Johann Keller; Wei-Kan Chu

Publisher: Elsevier Science
Year: 1978
Weight: 316 KB
Volume: 149
Category: Article
ISSN: 0029-554X
DOI: 10.1016/0029-554x(78)90893-5

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