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Channel length and width dependence of hot-carrier hardness in fluorinated MOSFETs

✍ Scribed by Nishioka, Y.; Ohyu, K.; Ohji, Y.; Ma, T.-P.


Book ID
121385051
Publisher
IEEE
Year
1989
Tongue
English
Weight
317 KB
Volume
10
Category
Article
ISSN
0741-3106

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