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Changes in chemical composition and nanostructure of SiC thin films prepared by PECVD during thermal annealing

✍ Scribed by Künle, Matthias ;Janz, Stefan ;Nickel, Klaus Georg ;Eibl, Oliver


Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
875 KB
Volume
208
Category
Article
ISSN
0031-8965

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