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Cell delay fault testing for iterative logic arrays

✍ Scribed by Shyue-Kung Lu; Cheng-Wen Wu; Ruei-Zong Hwang

Book ID: 104635596
Publisher: Springer US
Year: 1996
Tongue: English
Weight: 422 KB
Volume: 9
Category: Article
ISSN: 0923-8174
DOI: 10.1007/bf00134694

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