Dispersion of NiO Supported on γ-Al2O3 a
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Jun Wang; Lin Dong; Yuhai Hu; Guishan Zheng; Zheng Hu; Yi Chen
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Article
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2001
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Elsevier Science
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English
⚖ 388 KB
Laser Raman spectroscopy (LRS), X-ray di4raction (XRD), X-ray photoelectron spectroscopy (XPS), ultraviolet and di4use re6ectance spectroscopy (UV-DRS), and temperature-programmed reduction (TPR) are used to characterize a series of TiO 2 / -Al 2 O 3 , NiO/ -Al 2 O 3 , and NiO/TiO 2 / -Al 2 O 3 samp