Fluence-dependent carrier lifetime variation in heavily proton-irradiated Si detectors has been investigated by the microwave probed photoconductivity (MW-PCD) and transient grating (TG) techniques. Nearly linear decrease of carrier recombination lifetime, from hundreds of ns to few ns, as a functio
โฆ LIBER โฆ
Carrier mobility and lifetime in a-Si:H determined by the moving grating technique
โ Scribed by U. Haken; M. Hundhausen; L. Ley
- Book ID
- 115989050
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 265 KB
- Volume
- 164-166
- Category
- Article
- ISSN
- 0022-3093
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Fluence dependent carrier lifetime varia
โ
E. Gaubas; A. Kadys; J. Vaitkus; E. Fretwurst
๐
Article
๐
2007
๐
Elsevier Science
๐
English
โ 492 KB
Study of in-plane carrier transport in a
โ
Kiminori Hattori; Takeshi Mori; Hiroaki Okamoto; Yoshihiro Hamakawa
๐
Article
๐
1987
๐
Elsevier Science
๐
English
โ 187 KB
Excess carrier dispersion in conventiona
โ
C. Main; J. Berkin; R. Brรผggemann; J.M. Marshall
๐
Article
๐
1991
๐
Elsevier Science
๐
English
โ 253 KB
The light intensity exponent of the mino
โ
I Balberg; Y Lubianiker; L Fonseca; S.Z Weisz
๐
Article
๐
1998
๐
Elsevier Science
๐
English
โ 74 KB
Light-soaking and annealing kinetics of
โ
E. Morgado
๐
Article
๐
2002
๐
Elsevier Science
๐
English
โ 144 KB
Determination of carrier diffusion coeff
โ
Malinauskas, T. ;Jaraลกiลซnas, K. ;Ivakin, E. ;Tranchant, N. ;Nesladek, M.
๐
Article
๐
2010
๐
John Wiley and Sons
๐
English
โ 573 KB
## Abstract We report on a contactless, allโoptical study of carrier diffusion and recombination kinetics in singleโcrystalline diamond layers using the lightโinduced transient grating (LITG) technique. Decay times of transient diffraction grating yielded carrier lifetime of __ฯ__~R~โโโ3โns and bip