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Capped nanometer silicon electronic materials

✍ Scribed by Dr. Louis Brus


Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
298 KB
Volume
5
Category
Article
ISSN
0935-9648

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Structural and electronic properties of
✍ F. De Brito Mota; J. F. Justo; A. Fazzio πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 341 KB πŸ‘ 2 views

We developed an empirical potential for interactions between Si and N to describe silicon nitride systems using the Tersoff functional form. With this model, we explored the structural properties of amorphous silicon nitride through the Monte Carlo simulations and compared them to available experime