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Capacitance study of electron traps in low-temperature-grown GaAs

✍ Scribed by P. N. Brunkov; A. A. Gutkin; A. K. Moiseenko; Yu. G. Musikhin; V. V. Chaldyshev; N. N. Cherkashin; S. G. Konnikov; V. V. Preobrazhenskii; M. A. Putyato; B. R. Semyagin

Book ID: 110138663
Publisher: Springer
Year: 2004
Tongue: English
Weight: 102 KB
Volume: 38
Category: Article
ISSN: 1063-7826
DOI: 10.1134/1.1734663

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