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Capacitance measurement of semiconductor electrodes by means of the HP-4274A LCR meter

✍ Scribed by St. Popkirov, George

Book ID
120333075
Publisher
American Institute of Physics
Year
1990
Tongue
English
Weight
254 KB
Volume
61
Category
Article
ISSN
0034-6748

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Contact potential difference measurement
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## Abstract Changes of contact potential are observed in inversion layers induced in germanium by applying a reverse bias voltage in the vicinity of a p‐n junction. Comparison is made with changes of surface potential calculated from simultaneous measurements of channel conductance. Agreement is go