Capacitance changes in neutron irradiated n-type silicon: The flux effect

✍ Scribed by B. Novoselnik; M. Pilipovic; R. Jacimovic; B. Pivac; R. Slunjski; I. Capan

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 265 KB
• Volume: 268
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2010.04.017

✦ Synopsis

The influence of fast neutron flux on radiation-induced capacitance changes in heavily irradiated n-type Si has been studied by means of capacitance techniques. We have observed two regimes; flux-dependent and -independent for the case of high and low flux irradiation, respectively. A model that describes changes in the thermally stimulated capacitance as a function of time of irradiation has been proposed.