Capacitance and -Parameter Techniques for Dielectric Characterization With Application to High- PMNT Thin-Film Layers

✍ Scribed by Wenbin Chen; McCarthy, K.G.; Mathewson, A.; Copuroglu, M.; O'Brien, S.; Winfield, R.

• Book ID: 114620961
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 452 KB
• Volume: 59
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2012.2190365