𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Calibration of the internal energy distribution of ions produced by electrospray

✍ Scribed by C. Collette; E. De Pauw


Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
106 KB
Volume
12
Category
Article
ISSN
0951-4198

No coin nor oath required. For personal study only.

✦ Synopsis


The internal energy deposited in the ions in the source of a mass spectrometer governs their fragmentation and therefore the content of the spectra. When the ionization conditions are well defined and reproducible, e.g. in electron impact, the elaboration of databases benefits the use of the method. In electrospray, however, the source conditions are not strictly defined. The elaboration of spectra databases therefore requires a calibration of the internal energy of the ions that is valid for all types of spectrometers. A method for the calibration of the internal energy of ions in electrospray is presented, developed using the fragmentation reactions of a set of probe ions (benzylpyridinium salts) under various conditions (the voltage on the sampling cone, the nature of the collision gas, the composition of the mobile phase). The influence of the experimental conditions on the internal energy of the ions permits the calibration of individual working conditions.


πŸ“œ SIMILAR VOLUMES


Comparison of the internal energy distri
✍ C. Collette; L. Drahos; E. De Pauw; K. VΓ©key πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 79 KB πŸ‘ 1 views

The internal energies of the emitted ions can be modulated in an electrospray source through different experimental conditions. However, the fragmentation pattern depends also on conditions that cannot be controlled by the operator, e.g. the geometry of the source or the mode of transfer of the ions

Secondary Ions Produced by Low-energy Im
✍ T. Sato; A. Shimizu; K. Nakamura; K. Hiraoka πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 187 KB

Secondary ions produced by low-energy He + and Ne + ion impact on van der Waals solid thin films deposited on a silicon substrate were measured as a function of film thickness using a reflectron-type time-of-flight mass spectrometer. The intensities of secondary ions N + and N 3 + produced by 400 eV

On the origin of the abundance distribut
✍ Cecile Meunier; Marc Jamin; Edwin De Pauw πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 178 KB πŸ‘ 2 views

The abundance distribution of multiply charged ions produced during the electrospray process is thought to depend on the initial conformational state of the analyte in solution and on solution chemistry, but with some proteins, including apomyoglobin, the correlation between solution and mass spectr