𝔖 Bobbio Scriptorium
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Calibration of photodetectors in IR microscopes

✍ Scribed by G. L. Kuryshev; I. V. Mzhel’skii; A. E. Nastov’yak; V. G. Polovinkin

Book ID
111511178
Publisher
Allerton Press Inc
Year
2011
Tongue
English
Weight
208 KB
Volume
47
Category
Article
ISSN
8756-6990

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Reflection electron microscopy (REM) is used to calibrate the focusing steps and rotation of electron microscopes. The calibration of focusing steps is done by the direct measurement of the shift on in-focus positions in the REM micrographs. Rotations between the diffraction patterns and images are