✦ LIBER ✦

CALCULATION OF OPTICAL CONSTANTS IN POROUS SILICON THIN FILMS USING DIFFUSED AND SPECULAR REFLECTANCE MEASUREMENT

✍ Scribed by PEÑA, C.; TORRES, J.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Simultaneous determination of the optica

✍ Cao, Jianlin ;Yanagihara, Mihiro ;Yamamoto, Masaki ;Goto, Yoshinori ;Namioka, Ta 📂 Article 📅 1994 🏛 The Optical Society 🌐 English ⚖ 584 KB

Problem of ambiguity in the determinatio

✍ Lamprecht, K. ;Papousek, W. ;Leising, G. 📂 Article 📅 1997 🏛 The Optical Society 🌐 English ⚖ 299 KB

Reflectance measurements and optical con

✍ Larruquert, Juan I. ;Keski-Kuha, Ritva A. M. 📂 Article 📅 2000 🏛 The Optical Society 🌐 English ⚖ 159 KB

Transverse isotropic elastic moduli and

✍ Jennifer K. Cocson; Christine S. Hau; Peijou M. Lee; Clara C. Poon; Annita H. Zh 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 735 KB