Buried-oxide charge trapping induced performance degradation in fully-depleted ultra-thin SOI p-MOSFET's

✍ Scribed by Hua-Fang Wei; Chung, J.E.; Annamalai, N.K.

• Book ID: 114536509
• Publisher: IEEE
• Year: 1996
• Tongue: English
• Weight: 672 KB
• Volume: 43
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.506769