Bulk and surface phonons in superlattices of diatomic crystals
β Scribed by B. Djafari-Rouhani; J. Sapriel; F. Bonnouvrier
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 346 KB
- Volume
- 1
- Category
- Article
- ISSN
- 0749-6036
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Measurements" by Raman spectroscopy, oblique incidence far-IR power reflection spectroscopy and attenuated total reflection spectroscopy have been used to study bulk and surface phonons and plasmons in semiconductor superlattices and multiple quantum wells. Raman spectroscopy has been used to invest
We report far infrared measurements of oblique incidence power reflectivity and attenuated total reflection (ATR) on multiply Si 5--doped GaAs samples. The reflectivity spectrum in s-polarisation probes the in-plane component of the superlattice dielectric function, and is sensitive to the overall 3