Built-in test for VLSI: Pseudorandom techniques: by Paul H. Bardell, William H. McAnney and Jacob Savir, from: John Wiley, New York, NY, U.S.A.

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 62 KB
• Volume: 7
• Category: Article
• ISSN: 0167-9260
• DOI: 10.1016/0167-9260(89)90009-6