Built-in test for VLSI — pseudorandom techniques: Bardell, P H, McArney, W H and Savir, J Wiley, New York, NY, USA (1987) £45.00 pp 354

✍ Scribed by Colin Maunder

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 118 KB
• Volume: 13
• Category: Article
• ISSN: 0141-9331
• DOI: 10.1016/0141-9331(89)90036-7