Built-in test for complex digital integrated circuits: B. Konemann, J. Mucha and G. Zwiehoff Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn. 178, 89

• Book ID: 108361094
• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 140 KB
• Volume: 12
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(81)80207-8