Built-in test for complex digital integrated circuits : B. Konemann, J. Mucha and G. Zwiehoff. Fifth Solid State Circuits Conference—ESSCIRC 79, IEE Publn.178, 89

• Book ID: 103274750
• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 133 KB
• Volume: 20
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(80)90102-x