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Built-in self-test and diagnostic support for safety critical microsystems

✍ Scribed by T. Olbrich; A.M.D. Richardson; D.A. Bradley

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 573 KB
Volume: 36
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(96)00035-2

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