๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Building a feature-based object description from a boundary model

โœ Scribed by L. De Floriani; E. Bruzzone


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
841 KB
Volume
21
Category
Article
ISSN
0010-4485

No coin nor oath required. For personal study only.

โœฆ Synopsis


Form features, like protrusions or depressions on a/ace, through-holes or handles, can be extracted /rom a relational boundary model of a solid object, called the 'symmetric boundary graph" by loop identification and connected component labelling. The result is a decomposition ot the object boundary into volumetric components describing features, which is represented as a directed labelled multigraph, called the "object decomposition graph'. Based on such a model, issues such as representation uniqueness and matching4 of object descriptions are discussed.


๐Ÿ“œ SIMILAR VOLUMES


Query processing for integration of info
โœ Koichi Munakata ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 635 KB

When data are obtained from heterogeneous distributed information sources, all of the data do not always have the same structure, but they are sometimes different in data structure from instance to instance. As a data structure to integrate such semistructured data, we present the self-descriptive o

A cellular topology-based approach to ge
โœ Jae Yeol Lee; Joo-Haeng Lee; Hyun Kim; Hyung-Sun Kim ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 688 KB

Progressive mesh representation and generation have become one of the most important issues in network-based computer graphics. However, current researches are mostly focused on triangular mesh models. On the other hand, solid models are widely used in industry and are applied to advanced applicatio

Fieldstitching with Kirchhoff-boundaries
โœ Thomas Schuster; Stephan Rafler; Valeriano Ferreras Paz; Karsten Frenner; Wolfga ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 202 KB

Optical scatterometry has established itself as one of the mainly applied methods for CD metrology besides CD-SEM during the recent years. However, grating imperfections such as line edge roughness have been largely neglected in scatterometry models so far. Since imperfections of the perfect periodi