Bridge and van der Pauw Sheet Resistors for Characterizing the Line Width of Conducting Layers

✍ Scribed by Buehler, M. G.

• Book ID: 118155373
• Publisher: The Electrochemical Society
• Year: 1978
• Tongue: English
• Weight: 655 KB
• Volume: 125
• Category: Article
• ISSN: 0013-4651
• DOI: 10.1149/1.2131517