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Breakdown voltage improvement for thin-film SOI power MOSFET's by a buried oxide step structure

โœ Scribed by Kim, I.J.; Matsumoto, S.; Sakai, T.; Yachi, T.


Book ID
121728239
Publisher
IEEE
Year
1994
Tongue
English
Weight
280 KB
Volume
15
Category
Article
ISSN
0741-3106

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