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Bombardment-induced silicide formation at rhenium-silicon interfaces studied by XPS and TEM

โœ Scribed by R. Reiche; S. Oswald; D. Hofman; J. Thomas; K. Wetzig


Book ID
105897781
Publisher
Springer
Year
1999
Tongue
English
Weight
433 KB
Volume
365
Category
Article
ISSN
1618-2650

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