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Bismuth segregation enhances intermetallic compound growth in SnBi/Cu microelectronic interconnect

โœ Scribed by T.Y. Kang; Y.Y. Xiu; C.Z. Liu; L. Hui; J.J. Wang; W.P. Tong


Book ID
116607671
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
744 KB
Volume
509
Category
Article
ISSN
0925-8388

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